Università degli studi dell'Insubria

CHIMICA ANALITICA DEI MATERIALI MOD.A

Degree course: 
Corso di Second cycle degree in Chemistry
Academyc year when starting the degree: 
2012/2013
Year: 
2
Academyc year when helding the course: 
2013/2014
Course type: 
Supplementary compulsory subjects
Credits: 
3
Standard lectures hours: 
24
Detail of lecture’s hours: 
Lesson (24 hours)
Requirements: 

Basis and instrumental analytical chemistry; knowledge of the material structure both atomic and molecular; spectroscopical knowledge.

Assessment: 
Voto Finale

The main objective of the course is to provide the student the necessary information to plan and deal with the analysis of materials, from the standpoint of the characterization and chemical composition. The cases of study presented, outcome of a multidisciplinary approach of the problem solving, are illustrative of the detailed rules for the application of the knowledge acquired to develop the comprehension and personal ability to solve real problems.

The course aims to provide an overview of the main analytical techniques used in the analysis and characterization of materials.
Module A – Introduction interaction radiation/ particle -matter. Dualism of the concept "beam in - beam out" and associated analytical techniques. The emission of electrons; photoelectric effect. The emission of x-rays. The emission of particles/ions.
-Spectroscopic techniques. Techniques in fluorescence X : XRF and Total Reflection XRF; theoretical overview; rows K, L, M; a wavelength dispersion WDX and energy EDS. Raman Spectroscopy: theoretical overview and comparison with IR spectroscopy.
-Surface techniques and microscopy. Definition of surface. XPS-ESCA Brief introduction to theoretical aspects x-ray Photo-electronic Spectroscopy (XPS); application of XPS to chemical problems: Electron Spectroscopy for Chemical Application (ESCA); the concept of "binding energy" and using chemical analysis; examples of analysis; geometrical factors; electronic factors.
Module B - SEM-EDAX; TEM Brief introduction to theoretical aspects of electron interaction field; definition of secondary electrons, retro-disseminated and Auger; use of electrons for the electron microscopy and related practical issues; Description and generation of a secondary electron image and back-scattered (SEM); x-ray generation and recording a spectrum (EDAX); imaging techniques in x-ray (x-ray mapping); low vacuum techniques; description of the techniques in transmission (TEM). SIMS- ISS technical notes on "particles"; Secondary Ion Mass Spectrometry; Ion Scattering Spectrometry. STM;AFM theoretical Overview on the Tunnel effect; principle of operation of tunneling microscope (Scanning Tunneling Microscopy); atomic force microscopy (AFM); applications.
-Thermal analytical techniques, basic concepts; Thermo gravimetric techniques TGA; instrumental description and calibration; differential thermal analysis (DTA) and differential scanning calorimetry (DSC); instrumental description and calibration; examples of application.
-Applications and exercises
Module A and Module B – Frontal lectures and practical exercises, including activities on instrumentation and bibliographic research.

Slides, articles of specific literature.
Module A – Oral examination.
Module B – Oral examination about the theory and verification of the acquired knowledge in solving a real problem taken from the scientific literature.

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Borrowers