ANALYTICAL CHEMISTRY OF MATERIALS
Basic analytical chemistry and instrumental; knowledge about the structure of matter at the atomic and molecular level; spectroscopy of knowledge.
Written test (2 hours) based on two questions:
1- Describe a specific analytical technique, theoretical bases, applications.
2- Propose an alternative analytical approach for the solution of a real problem taken from scientific literature.
The course's main objective is to provide students with the information needed to plan and deal with the analysis of materials, from the point of view of the characterization and chemical composition. The presented case studies, the result of multidisciplinary approach of "problem solving," are examples of how to implement these findings in order to develop personal understanding and skills in solving real problems.
The course will offer an overview of the main analytical techniques used in the analysis and characterization of materials.
- Introduction (4h)
Interaction radiation / particle-matter.
Dualism of concept "beam in - beam out" and associated analytical techniques.
The emission of electrons; photoelectric effect.
Emissions of particle/ion
X-Ray Fluorescence Spectrometry:XRF and Total Reflection XRF; theoretical signs; lines K, L, M; tools to dispersion of WDX wavelength and energy of EDS. Micro-XRF, Imaging techniques, XANES/EXAFS basis. (10h)
Raman spectroscopy: theoretical outline and comparison with the IR spectroscopy. (2h)
Moessbauer spectroscopy: theoretical outline and applications. (4h)
Surface and microscopy techniques
Brief introduction to the theoretical aspects X-ray photo-electronic Spectroscopy (XPS); Application of XPS in chemical problems: Electron Spectroscopy for Chemical Applications (ESCA); concept of "binding energy" and use in chemical analysis; Examples of analysis; geometric factors; electronic factors. (8h)
Brief introduction to the theoretical aspects of the interaction electron-matter; definition of secondary electrons, back-scattered and Auger electrons; use of electron microscopy and practical problems; Instrumental description (SEM), generation of secondary and back-scattered electrons images; X-ray generation and spectrum recording(EDAX); X-ray "imaging" techniques(X-ray mapping); low vacuum techniques ( "low vacuum"); description of TEM. (6h)
Brief introduction to "particles" techniques; Secondary Ion Mass Spectrometry; Ion Scattering Spectrometry. (2h)
A theoretical outline on the effect Tunnel; principle of tunneling microscope operation (Scanning Tunneling Microscopy); Atomic force microscopy (AFM); applications. (2h)
Thermal Analytical Techniques
Basic concepts; thermo gravimetric analysis TGA; Instrumental description and calibration; differential thermal analysis (DTA) and differential scanning calorimetry (DSC); Instrumental description and calibration; application examples. (6h)
- Applications and Tutorials (4h)
Surface Analysis – The Principal Techniques
JOHN C. VICKERMAN, IAN S. GILMORE
©2009 John Wiley & Sons Ltd
Handbook of Analytical Techniques
edited by Helmut Giinzler and Alex Williams
WILEY-VCH Verlag GmbH
Classroom lectures and practices, including activities on instrumentation and literature search.